Optical, Dielectric and Optoelectronic Properties of Spray Deposited Cu-doped Fe2O3 Thin Films

Adeniyi Yisau Fasasi; Emmanuel Ajenifuja; Edward Osagie; Lukman Animashaun; Abiodun  Adeoye; Eusebius Obiajunwa

doi:10.46481/jnsps.2023.1180

Authors

A. Y. Fasasi
Center for Energy Research and Development, Obafemi Awolowo University, Ile-Ife, Nigeria
E. Ajenifuja
[email protected]

Center for Energy Research and Development, Obafemi Awolowo University, Ile-Ife, Nigeria.
E. Osagie
Center for Energy Research and Development, Obafemi Awolowo University, Ile-Ife, Nigeria
L. O. Animasaun
Department of Physics, Electronics & Earth Sciences, Fountain University, Osogbo, Nigeria
A. E. Adeoye
Technical University, Km 15, Lagos Ibadan Expressway, Ibadan, Oyo State, Nigeria.
E. I. Obiajunwa
Center for Energy Research and Development, Obafemi Awolowo University, Ile-Ife, Nigeria

Keywords:

thin film, bandgap, Urbach Energy, refractive index, dispersion parameters, Oscillator parameters

Abstract

Copper-doped hematite thin films were prepared by spray pyrolysis technique using a mixture of ethanol and distilled water precursors. Visual observations showed that aqua precursor produced films of less integrity compared with ethanol that produced thin, uniform and transparent yellowish-brown films that adhered well to the substrate. Composition and thickness measurements determined by RBS revealed that ethanol precursor produced thinner films of 94.45 and 51.77 nm while aqua precursor produced films of 1,370 and 1,120 nm for undoped and Cu-doped Fe2O3 respectively. This is an indication that ethanol solutions produced nano-thick films of high integrity. The composition revealed that only the Cu-doped Fe2O3 deposited by ethanol solution gave composition close to stoichiometric Fe2O3 while the others gave non-stoichiometric Fe(OH)3 . Optical characterization carried out using UV-visible spectrophotometer in transmittance mode indicated that the film thickness was directly proportional to the number of passes which is inversely proportional to the transmittance. Three bandgap determination methods namely; Tauc, Absorption Fitting Spectrum (AFS) and Davis-Mott were employed with the result that Tauc and AFS gave close direct and indirect bandgap energies (Eg) of 3.44 and 1.98 for AFS and 3.43 and 2.32 eV for Tauc respectively. The Urbach tail energy determined was 1,100 meV which is an indication of a broad onset of absorption. The steepness parameter (?) was found to be 7.83 while the electron-phonon (Eph ) coupling energy was found to be 0.85 eV. It was also observed that the refractive index (n) was about 15 times greater than the extinction coefficient (k). In the study of the dispersion parameters using single oscillator and Sellmier models, the values of the single oscillator energy (Eosc ), dispersion energy (Ed), zero frequency dielectric constant, zero frequency refractive index, the average oscillator strength (So), the average oscillator parameter and the dispersion parameters were determined. All the values of the parameters estimated are of the same order of magnitude with other semiconducting materials. The study showed that Cu-doped Fe2O3 could be employed as dielectric material as well as in optoelectronic devices.

Dimensions

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