Performance Analysis of Photovoltaic Systems Using (RAMD) Analysis

Abstract

The primary aim of this present study is to examine how reliability, availability, maintainability, and dependability (RAMD) are used to describe the criticality of each sub-assembly in grid- connected photovoltaic systems. A transition diagram of all subsystems is produced for this analysis, and Chapman-Kolmogorov differential equations for each variable of each subsystem are constructed using the Markov birth-death process. Both random failure and repair time variables have an exponential distribution and are statistically independent. A sufficient repair facility is still available with the device. The numerical results for reliability, maintainability, dependability, and steady-state availability for various photovoltaic device components have been obtained. Other metrics, such as mean time to failure (MTTF), mean time to repair (MTTR), and dependability ratio, which aid in device performance prediction, have also been measured. According to numerical analysis. it is hypothesized that subsystem S4, i.e. the inverter, is the most critical and highly sensitive portion that requires special attention in order to improve the efficiency of the PV device plant. The findings of this research are very useful for photovoltaic system designers and maintenance engineers.